Key Materials in Optical Radiation Metrology

Precision calculation of blackbody radiation shifts for optical frequency metrology.

We show that three group IIIB divalent ions, B(+), Al(+), and In(+), have anomalously small blackbody radiation (BBR) shifts of the ns(2) (1)S(0)-nsnp (3)P(0)(o) clock transitions. The fractional BBR shifts for these ions are at least 10 times smaller than those of any other present or proposed optical frequency standards at the same temperature, and are less than 0.3% of the Sr clock shift. We...

Gamma Radiation Studies on Optical Materials

Results for the effects of on materials for a new laser-driven accelerator are presented. Various optical and laser materials are compared. While Si and fused c-SiO appear ideal for sub-bandgap laser wavelengths, other interesting candidates include certain fluorides and compound semiconductors.

Optical Metrology Third Edition

Optical Metrology of Thin Films

A non-contact and non-destructive laser-based acoustic technique called impulsive stimulated thermal scattering (ISTS) is demonstrated for new applications in the context of a compact, portable apparatus. ISTS is used to determine viscoelastic and thermal transport properties of a DuPont Kapton film before and after neutron irradiation to determine the changes that would be expected to occur in...

Optical Metrology under Extreme Conditions

Optical metrology provides full field, noncontact, precise measurement of various physical parameters of materials, structures, and devices. These properties include kinematic parameters (displacement, velocity, and acceleration), deformation parameters (strains, curvature, and twist), surface parameters (shape and roughness), and mechanical properties of materials (Young’s modulus, Poisson’s r...